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Description:
X-ray diffractometer is a widely used analytical instrument. XD series X-ray powder diffractometer mainly applies to phase analysis, crystal structure analysis, material tissue analysis, macrostress determination, microscopic stress determination, crystal size determination, degree of crystallinity determination etc, so it is widely used in material science, physics, chemistry, chemical industry, metallurgy, mineral, medication, plastic industry, chinaware, and even archaeology, commodities inspection and many other applications. It is also the necessary large-scale analytical instruments for universities, scientific research institutions and mineral companies.
Details:
Rated power
| 3KW
| X-ray tube voltage
| 15-60KV, 1KV each step
| X-ray tube current
| 6-50mA, 1mA each step
| Stability
| <0 .01% (power/voltage ±10%)
| Safety guarantee and alarm device
| Radiation protection, locks on doors and windows; X-ray outside radiation protection cover lowers than 0.2μ Sv/hr
| Limit protection of X-ray power
| 0.35 - 2.7KW (6 steps)
| Type Vertical
| Vertical scanning
| Measurement range
| -30°~ 160°
| Minimum step size
| 0.0005°
| Setting reproducibility
| 0.0006°
| Slit: Divergence slit:
| 1/6, 1/2, 1,2°
| Receiving slit
| 0.1, 0.15, 0.3, 0.45, 0.6, 1.0, 2.0mm
| Scattering slit
| 1/2°, 1°,2°
| Software
| Diffraction line measurement.
Count in fixed time, time in fixed count, goniometer slew.
goniometer step forward or backward, goniometer alignment,2θverification. processing of diffraction, pattern, editing, displaying and plotting of diffraction pattern. Peak searching. Peak area measurement and single peak analysis. Background elimination. Smoothing.
Compression of patterns. Inquiry about Data. Basic physical and chemical constant. Periodic table of elements. Basic physical properties and crystal structures of elements. Mass absorption coefficient of elements. Calculation 2θ from d; calculation d from 2θ.Reference intensity rate K. Parameters of K characteristic spectra of element.
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